• DocumentCode
    922652
  • Title

    Fabrication and analysis of high-efficiency polycrystalline silicon solar cells

  • Author

    Sana, Peyman ; Salami, Jalal ; Rohatgi, Ajeet

  • Author_Institution
    Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    40
  • Issue
    8
  • fYear
    1993
  • fDate
    8/1/1993 12:00:00 AM
  • Firstpage
    1461
  • Lastpage
    1468
  • Abstract
    Phosphorus and aluminum gettering conditions were optimized to achieve high-frequency polycrystalline silicon cells. In order to take advantage of intense gettering without the harmful effects of the emitter dead layer, a deep phosphorus diffusion at 930°C was performed, followed by a partial etch-back of the n+ region. The optimum aluminum treatment for these cells included 1.2-μm-thick Al deposition followed by 850°C, 35-min drive-in. Oxide passivation was found to be effective in cells made on these polysilicon wafers. A combination of optimum phosphorus and aluminum getting, oxide passivation, and double-layer antireflection coating resulted in record 17.7% efficient, 1-cm2, cells under one sun illumination. Cell model calculations were performed ignoring the grain boundary effects, but using a measured effective lifetime in the cell. A good correlation was found between measured and calculated cell parameters of the 17.7% efficient polycrystalline silicon cell. Model calculations were extended to outline an approach toward achieving greater than 20% efficient cells
  • Keywords
    elemental semiconductors; etching; getters; passivation; silicon; solar cells; 17.7 percent; 35 min; 850 degC; 930 degC; double-layer antireflection coating; effective lifetime; gettering conditions; one sun illumination; partial etch-back; passivation; polycrystalline silicon solar cells; polysilicon wafers; Aluminum; Coatings; Etching; Fabrication; Gettering; Lighting; Passivation; Semiconductor device modeling; Silicon; Sun;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.223706
  • Filename
    223706