• DocumentCode
    923407
  • Title

    Pulsed measurement of transistor-base charge against collector current

  • Author

    Bridgen, R.

  • Author_Institution
    Philips Research Laboratories, Redhill, UK
  • Volume
    9
  • Issue
    16
  • fYear
    1973
  • Firstpage
    366
  • Lastpage
    367
  • Abstract
    A transistor measurement is described in which a pulse is applied to the emitter, and the base and collector current waveforms are measured and recorded using a sampling oscilloscope and data logger. The measurements are then processed by computer to determine the variation of the charge and the fT with the collector current under large-signal transient conditions
  • Keywords
    bipolar transistors; charge measurement; electronics applications of computers; impulse testing; semiconductor device testing; waveform analysis; bipolar transistors; charge measurement; computer; data logger; impulse testing; laser signal transient conditions; sampling oscilloscope; semiconductor device testing; waveform analysis;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19730270
  • Filename
    4236218
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=923407