Title :
Pulsed measurement of transistor-base charge against collector current
Author_Institution :
Philips Research Laboratories, Redhill, UK
Abstract :
A transistor measurement is described in which a pulse is applied to the emitter, and the base and collector current waveforms are measured and recorded using a sampling oscilloscope and data logger. The measurements are then processed by computer to determine the variation of the charge and the fT with the collector current under large-signal transient conditions
Keywords :
bipolar transistors; charge measurement; electronics applications of computers; impulse testing; semiconductor device testing; waveform analysis; bipolar transistors; charge measurement; computer; data logger; impulse testing; laser signal transient conditions; sampling oscilloscope; semiconductor device testing; waveform analysis;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19730270
