• DocumentCode
    925568
  • Title

    Numerical simulation of AlGaAs/GaAs heterojunction bipolar transistors with various collector parameters

  • Author

    Horio, Kazushige ; Iwatsu, Yasunori ; Yanai, Hisayoshi

  • Author_Institution
    Shibaura Inst. of Technol., Tokyo, Japan
  • Volume
    36
  • Issue
    4
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    617
  • Lastpage
    624
  • Abstract
    Numerical simulations of AlGaAs/GaAs HBTs (heterojunction bipolar transistors) with various collector parameters are carried out to investigate the cutoff frequency characteristics, using the conventional static model and the energy transport model. It is shown that the transit time in the collector depletion layer is an intrinsically more important factor than the collector charging time. Therefore, a thinner n--layer with higher doping density is desirable to achieve higher cutoff frequency, fT. It is found that the importance of energy transport effects arises from the fact that the actual electron energy deviates strongly from the field determined energy. The velocity overshoot can occur in a graded bandgap base and in the collector depletion layer, resulting in much higher fT than that predicted by the conventional model. A value of F T higher than 140 GHz is expected for an HBT with an n --layer thickness of 1000 Å
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; 1000 Å; AlGaAs-GaAs; collector charging time; collector depletion layer; collector parameters; cutoff frequency; doping density; electron energy; emitter-base regions; energy transport model; heterojunction bipolar transistors; n--layer thickness; static model; transit time; velocity overshoot; Charge carrier processes; Cutoff frequency; Doping; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Molecular beam epitaxial growth; Numerical simulation; Poisson equations; Semiconductor process modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.22465
  • Filename
    22465