DocumentCode
925695
Title
RF burnout dependence on variation in barrier capacitance of mixer diodes
Author
Anand, Y.
Author_Institution
Microwave Associates, Inc., Burlington, Mass.
Volume
61
Issue
2
fYear
1973
Firstpage
247
Lastpage
248
Abstract
A novel scheme to measure the VSWR and the "phase variation" of mixer diodes at high RF power levels is described. This experimental test system provides a nondestructive way of determining the power-handling capability of a mixer diode and also serves as an important tool in improving the burnout performance of point contact and Schottky barrier diodes.
Keywords
Capacitance; Circuit testing; Counting circuits; Pulse amplifiers; Pulse modulation; Radio frequency; Schottky barriers; Schottky diodes; Switches; System testing;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1973.9017
Filename
1450947
Link To Document