• DocumentCode
    925776
  • Title

    Base spreading resistance of square-emitter transistors and its dependence on current crowding

  • Author

    Rein, H. ; Schroter, M.

  • Author_Institution
    Inst. fuer Electron., Ruhr-Univ., Bochum, West Germany
  • Volume
    36
  • Issue
    4
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    770
  • Lastpage
    773
  • Abstract
    The internal DC and small-signal low-frequency base-spreading resistances of a square-emitter transistor have been calculated analytically as a function of base current. Simplifying assumptions result in a nonlinear differential equation with a simple explicit solution. The validity of the assumptions has been checked by exact numerical device simulation. The error of the analytical approximation has a maximum of only 11% at negligible current crowding (rBi-rBi,0=rs /32 instead of the exact value rs/28.6). In the total operating range of interest, the error of the analytical expression for rBi can be dropped to negligible values if the exact value of rBi,0 is inserted
  • Keywords
    bipolar transistors; nonlinear differential equations; analytical expression; base current; current crowding; internal DC; nonlinear differential equation; small-signal low-frequency base-spreading resistances; square-emitter transistors; Bipolar transistors; Differential equations; Doping; Electron devices; Error analysis; Nuclear magnetic resonance; Numerical simulation; Photonic band gap; Proximity effect; Semiconductor impurities;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.22486
  • Filename
    22486