• DocumentCode
    926067
  • Title

    EMACK improvements, present and future

  • Author

    Calvin, H.A. ; Craddock, W. ; Mckee, B.D. ; Dunham, C.

  • Author_Institution
    Westinghouse Electr. Corp., Sunnyvale, CA, USA
  • Volume
    25
  • Issue
    1
  • fYear
    1989
  • fDate
    1/1/1989 12:00:00 AM
  • Firstpage
    111
  • Lastpage
    115
  • Abstract
    A three-step program has been developed to improve the single-shot performance and to add 1-Hz repetitive operation capabilities to the EMACK electromagnetic launcher system. Single-shot performance is improved in two steps: first by copper-plating the HPG (homopolar generator) rotor, increasing the switch shuttle surface area, and developing a stronger barrel; and then by augmenting the inductive store support structure to withstand the increased electromagnetic forces at higher current, modifying the HPG rotor with a Be-Cu sleeve, and adding a flywheel. These modifications will allow operation of the system at a peak current of 2.2 MA. Repetitive operation of the system is gained by significantly modifying the linear rail switch to accommodate multiple shuttles, adding a repetitive loader, and cooling the muzzle and dump resistors. Larger masses could be accelerated by increasing the size of the flywheel. Repetitive operation of the EMACK launcher at frequencies in the neighborhood of 1 Hz is made possible by using a high-resistance muzzle resistor to drop the HPG current to a low value between shots
  • Keywords
    electromagnetic launchers; homopolar generators; switches; EMACK electromagnetic launcher system; barrel; dump resistors; electromagnetic forces; homopolar generator; inductive store support structure; linear rail switch; multiple shuttles; muzzle resistor; repetitive loader; rotor; switch shuttle surface area; Acceleration; Cooling; Electromagnetic forces; Electromagnetic launching; Flywheels; Frequency; Rails; Resistors; Rotors; Switches;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.22517
  • Filename
    22517