DocumentCode
926327
Title
Two Simple Methods For The Measurement Of The Dielectric Permittivity Of Low-Loss Microstrip Substrates
Author
Jervis, B.W.
Volume
29
Issue
4
fYear
1981
fDate
4/1/1981 12:00:00 AM
Firstpage
383
Lastpage
386
Abstract
Two simple methods are presented for the measurement of the dielectric permittivity of low-loss microstrip substrates. The permittivity associated with a specific length of microstrip may be obtained. The methods are not wasteful of substrate material.
Keywords
Conducting materials; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency; Impedance; Microstrip; Optimized production technology; Permittivity measurement; Transmission line measurements;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1981.1130362
Filename
1130362
Link To Document