DocumentCode
926530
Title
Invariant fitting of two view geometry
Author
Torr, P.H.S. ; Fitzgibbon, A.W.
Author_Institution
Sch. of Math. & Comput., Oxford Brookes Univ., UK
Volume
26
Issue
5
fYear
2004
fDate
5/1/2004 12:00:00 AM
Firstpage
648
Lastpage
650
Abstract
This paper describes an extension of Bookstein´s and Sampson´s methods, for fitting conics, to the determination of epipolar geometry, both in the calibrated case, where the Essential matrix E is to be determined or in the uncalibrated case, where we seek the fundamental matrix F. We desire that the fitting of the relation be invariant to Euclidean transformations of the image, and show that there is only one suitable normalization of the coefficients and that this normalization gives rise to a quadratic form allowing eigenvector methods to be used to find E or F, or an arbitrary homography H. The resulting method has the advantage that it exhibits the improved stability of previous methods for estimating the epipolar geometry, such as the preconditioning method of Hartley, while also being invariant to equiform transformations.
Keywords
computational geometry; curve fitting; eigenvalues and eigenfunctions; image motion analysis; least squares approximations; matrix algebra; Bookstein methods; Essential matrix; Euclidean transformations; Hartley preconditioning method; Sampson methods; conics; eigenvector methods; epipolar geometry; equiform transformations; fundamental matrix; homography; image motion analysis; invariant fitting; least squares approximations; normalization; quadratic form; two-view geometry; Calibration; Cameras; Eigenvalues and eigenfunctions; Fitting; Geometry; Image analysis; Least squares approximation; Least squares methods; Motion analysis; Stability; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Photogrammetry; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2004.1273967
Filename
1273967
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