Title :
Effect of Electrode Spacing on the Equivalent Base Resistance of Point-Contact Transistors
Author_Institution :
Bell Telephone Laboratories, Murray Hill, N.J.
Abstract :
A theoretical expression for the equivalent base resistance ¿b of point-contact transistors is derived here. This expression is shown to check experimental values reasonably well if the severity of some assumptions made for purposes of analysis is considered. Electrode spacing, germanium-slice thickness, and resistivity of the semiconductor are shown to be the properties that affect ¿b primarily.
Keywords :
Charge carrier lifetime; Conductivity; Contact resistance; Electric variables; Electrical resistance measurement; Electrodes; Equivalent circuits; Germanium; Surface resistance; Voltage;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1952.273975