DocumentCode :
926641
Title :
Effect of Electrode Spacing on the Equivalent Base Resistance of Point-Contact Transistors
Author :
Valdes, L.B.
Author_Institution :
Bell Telephone Laboratories, Murray Hill, N.J.
Volume :
40
Issue :
11
fYear :
1952
Firstpage :
1429
Lastpage :
1434
Abstract :
A theoretical expression for the equivalent base resistance ¿b of point-contact transistors is derived here. This expression is shown to check experimental values reasonably well if the severity of some assumptions made for purposes of analysis is considered. Electrode spacing, germanium-slice thickness, and resistivity of the semiconductor are shown to be the properties that affect ¿b primarily.
Keywords :
Charge carrier lifetime; Conductivity; Contact resistance; Electric variables; Electrical resistance measurement; Electrodes; Equivalent circuits; Germanium; Surface resistance; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1952.273975
Filename :
4050847
Link To Document :
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