DocumentCode :
926701
Title :
Variation of Transistor Parameters with Temperature
Author :
Coblenz, Abraham ; Owens, Harry L.
Author_Institution :
Signal Corps Engineering Laboratories, Fort Monmouth, N.J.
Volume :
40
Issue :
11
fYear :
1952
Firstpage :
1472
Lastpage :
1476
Abstract :
In this paper results of a study to determine the temperature dependence of the electrical characteristics of Type 1698 and 1768 transistors are given. Variations of transistor parameters as a function of temperature are given for each type of unit. Cumulative distribution curves are also given for the transistors studied. The implications of the results obtained with regard to transistor operation at elevated temperatures are discussed briefly.
Keywords :
Circuit testing; Current measurement; Electric variables; Electrical resistance measurement; Frequency measurement; Laboratories; Temperature dependence; Temperature distribution; Voltage; Voltmeters;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1952.273981
Filename :
4050853
Link To Document :
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