Title :
Use of specific emitter efficiency in evaluation and design of bipolar transistors
Author :
Saltich, J.L. ; Volk, C.E. ; Clark, L.E.
Author_Institution :
Motorola, Inc., Phoenix, Ariz.
fDate :
5/1/1973 12:00:00 AM
Abstract :
This letter presents experimental data which extend the concept of specific emitter efficiency as a determinant of current gain to its effect on the ancillary device parameter of subemitter base sheet resistance. This is important, for example, in predicting pinch resistor values and in evaluating current-crowding effects.
Keywords :
Baseband; Bipolar transistors; Current measurement; Cutoff frequency; Distortion; Filtering; Filters; Sampling methods; Signal sampling; Transfer functions;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1973.9139
