A vector intermodulation analyzer applied to behavioral modeling of nonlinear amplifiers with memory

Author

Walker, Aaron ; Steer, Michael ; Gard, Kevin G.

Author_Institution

Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA

Volume

54

Issue

5

fYear

2006

fDate

5/1/2006 12:00:00 AM

Firstpage

1991

Lastpage

1999

Abstract

A large signal vector intermodulation network analyzer with a dynamic range of 90 dB and phase resolution of better than 2° is reported. The analyzer is used in conjunction with a multislice behavioral model to characterize memory effects in three different RF power amplifiers: an MOSFET instrumentation amplifier, a multistage GaAs/silicon-based broadband microwave integrated-circuit amplifier, and an SiGe HBT monolithic-microwave integrated-circuit amplifier. The multislice behavioral model architecture builds on conventional single-tone AM-AM and AM-PM modeling extended to capture long-term memory effects that are characterized by asymmetric intermodulation distortion (IMD). Phase asymmetries of upper and lower IMD are captured. A systematic procedure for extracting the model is presented.

Keywords

Ge-Si alloys; III-V semiconductors; MOSFET; gallium arsenide; heterojunction bipolar transistors; instrumentation amplifiers; integrated circuit modelling; microwave power amplifiers; GaAs-Si; HBT monolithic-microwave integrated-circuit amplifier; MOSFET instrumentation amplifier; RF power amplifiers; SiGe; asymmetric intermodulation distortion; behavioral modeling; intermodulation asymmetry; intermodulation phase measurement; microwave integrated-circuit amplifier; multislice behavioral model; nonlinear amplifiers; nonlinear memory effects; vector intermodulation network analyzer; Broadband amplifiers; Dynamic range; MOSFET circuits; Microwave amplifiers; Power amplifiers; Power system modeling; Radio frequency; Radiofrequency amplifiers; Signal analysis; Signal resolution; Behavioral modeling; intermodulation asymmetry; intermodulation phase measurement; multislice model; nonlinear memory effects;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/TMTT.2006.872810

Filename

1629041