• DocumentCode
    928463
  • Title

    A Fine Resolution TDC Architecture for Next Generation PET Imaging

  • Author

    Yousif, Abdel S. ; Haslett, James W.

  • Author_Institution
    Calgary Univ., Calfary
  • Volume
    54
  • Issue
    5
  • fYear
    2007
  • Firstpage
    1574
  • Lastpage
    1582
  • Abstract
    A fine resolution and process scalable CMOS time-to-digital converter (TDC) architecture is presented. A 6-bit fine resolution TDC design using the new architecture is evaluated for positron emission tomography (PET) imaging application. The TDC architecture uses a hierarchical delay processing structure to achieve single cycle latency and high speed of operation. The fine resolution converter, realized in 130 nm CMOS, is designed to operate over a reference clock frequency of 500 MHz but can be scaled to multi GHz operation through time interleaving. Without external calibration, the TDC is used as a 5-bit fine resolution converter with 4.65 ENOB (effective number of bits). Under this condition, the 6-bit TDC has an INL (integral non-linearity) measurement of less than 1.45 LSB and a DNL (differential non-linearity) measurement of less than 1.25 LSB. With external calibration, a reduction of more than 50% in INL/DNL nonlinearities is demonstrated improving the ENOB to 5.5 bits, pushing the TDC to a 6-bit fine resolution operation. The TDC has a 31 ps timing resolution and power consumption of less than 1 mW. The design is believed to be the fastest and the lowest power consuming fine resolution TDC in the literature.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; biomedical imaging; calibration; positron emission tomography; CMOS time-to-digital converter architecture; PET imaging; calibration; fine resolution TDC architecture; hierarchical delay processing structure; positron emission tomography imaging; CMOS process; Calibration; Clocks; Delay; Frequency conversion; High-resolution imaging; Image resolution; Interleaved codes; Positron emission tomography; Timing; Analog-to-digital converter (ADC); CMOS; positron emission tomography (PET); time-of-flight (TOF); time-to-digital converter (TDC);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2007.903183
  • Filename
    4346750