DocumentCode
928628
Title
Shrinkage estimation of threshold parameter of the exponential distribution [reliability theory]
Author
Chiou, Paul ; Han, C.P.
Author_Institution
Dept. of Math., Lamar Univ., Beaumont, TX, USA
Volume
38
Issue
4
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
449
Lastpage
453
Abstract
The authors study the usual preliminary test estimator of the threshold parameter of the exponential distribution in censored samples. The optimal levels of significance and their corresponding critical values for the preliminary test are obtained. The optimal values of shrinkage coefficients for a preliminary test shrinkage estimator are also obtained on the basis of the minimax regret criterion
Keywords
life testing; minimax techniques; reliability theory; statistical analysis; censored samples; exponential distribution; life testing; minimax regret criterion; optimal levels of significance; preliminary test estimator; reliability; shrinkage coefficients; shrinkage estimation; threshold parameter; Exponential distribution; Life estimation; Life testing; Mean square error methods; Minimax techniques; Parameter estimation; Reliability theory; State estimation; Statistical analysis; Statistical distributions;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.46461
Filename
46461
Link To Document