• DocumentCode
    929952
  • Title

    Low-frequency capacitance measurements

  • Author

    Muzii, L. ; Piccialli, A. ; Ravarino, S.

  • Author_Institution
    UniversitÃ\xa0 dell´Aquila, Istituo di Fisica, Aquila, Italy
  • Volume
    11
  • Issue
    20
  • fYear
    1975
  • Firstpage
    487
  • Lastpage
    488
  • Abstract
    The letter proposes a technique for the fast determination at extremely low frequencies of the capacitance and leakage components of capacitors. The proposed method permits the measurement of C and G in only a few cycles. An apparatus is described employing this technique for the automatic measurement of m.o.s. capacitance as a function of frequency and bias voltage.
  • Keywords
    capacitance measurement; leakage currents; loss measurement; metal-insulator-semiconductor structures; MOS capacitance; automatic measurement; capacitors; leakage components; low frequency capacitance measurements;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19750377
  • Filename
    4236903
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=929952