DocumentCode :
930162
Title :
Computation of drain and substrate currents in ultra-short-channel nMOSFET´s using the hydrodynamic model
Author :
Rahmat, Khalid ; White, Jacob ; Antoniadis, Dimitri A.
Author_Institution :
MIT, Cambridge, MA, USA
Volume :
12
Issue :
6
fYear :
1993
fDate :
6/1/1993 12:00:00 AM
Firstpage :
817
Lastpage :
824
Abstract :
The authors develop a robust and efficient numerical solution of the hydrodynamic model, which solves the energy balance equation, and compare predictions of this model, using one set of parameters, with experimental nMOSFET characteristics for a range of channel lengths down to ultrashort channels. The substrate current is calculated by direct integration of the energy distribution function, which uses the computed temperature to obtain the number of high energy electrons. The drain current calculated using this method is accurate for a range of channel lengths and biases, and correctly predicts the observed enhanced transconductance for ultrashort-channel devices. The substrate current matches the experimental data for a range of channel lengths and biases above threshold with one set of physically reasonable parameters
Keywords :
electric current; insulated gate field effect transistors; semiconductor device models; channel lengths; drain current; energy balance equation; energy distribution function; high energy electrons; hydrodynamic model; nMOSFET; substrate currents; transconductance; ultra-short-channel; ultrashort channels; Distributed computing; Distribution functions; Electrons; Equations; Hydrodynamics; MOSFET circuits; Predictive models; Robustness; Temperature distribution; Transconductance;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.229756
Filename :
229756
Link To Document :
بازگشت