Title :
Knowledge-based test generation
Author_Institution :
Cirrus Computers Limited, Fareham, UK
fDate :
6/1/1985 12:00:00 AM
Abstract :
One view of what constitutes a testable circuit design is that sufficient circuit knowledge exists to allow an effective test program to be generated. HITEST is a test-generation system based on the definition, capture and use of knowledge items about the elements and overall behaviour of the circuit. The paper describes the general form of the knowledge items and indicates how the system makes use of and is constrained by the knowledge.
Keywords :
circuit CAD; expert systems; integrated circuit testing; logic CAD; logic testing; CAD; HITEST; IC testing; computer-aided design; knowledge-based system; logic testing; test-generation system; testable circuit design;
Journal_Title :
Electronic Circuits and Systems, IEE Proceedings G
DOI :
10.1049/ip-g-1:19850023
