DocumentCode :
932654
Title :
Placement-Proximity-Based Voltage Island Grouping Under Performance Requirement
Author :
Wu, Huaizhi ; Wong, Martin D F ; Liu, I-Min ; Wang, Yusu
Author_Institution :
Atoptech Inc., Santa Clara
Volume :
26
Issue :
7
fYear :
2007
fDate :
7/1/2007 12:00:00 AM
Firstpage :
1256
Lastpage :
1269
Abstract :
High power consumption not only leads to short battery life for hand-held devices but also causes on-chip thermal and reliability problems in general. As power consumption is proportional to the square of supply voltage, reducing supply voltage can significantly reduce power consumption. Multi-supply voltage (MSV) has previously been introduced to provide finer grain power and performance tradeoff. In this paper, we propose a methodology on top of a set of algorithms to exploit nontrivial voltage island boundaries for optimal power versus design-cost tradeoff under performance requirement. Our algorithms are efficient, robust, and error-bounded and can be flexibly tuned to optimize for various design objectives (e.g., minimal power within a given number of voltage islands, or minimal fragmentation in voltage islands within a given power bound) depending on the design requirement. Our experiment on real industry designs shows a tenfold improvement of our method over current logical-boundary-based industry approach.
Keywords :
integrated circuit reliability; logic partitioning; low-power electronics; system-on-chip; battery life; current logical boundary; hand-held devices; integrated circuit reliability; low-power electronics; placement proximity; power consumption; supply voltage reduction; system-on-chip; voltage island boundaries; voltage island grouping; Algorithm design and analysis; Batteries; Capacitance; Clocks; Energy consumption; Frequency; Leakage current; Power dissipation; Subthreshold current; Voltage; Low power; optimization; timing; voltage island;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2006.888270
Filename :
4237245
Link To Document :
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