Title :
Selective Deposition of Silicon at Room Temperature Using DC Microplasmas
Author :
Wilson, Chester G. ; Gianchandani, Yogesh B.
Author_Institution :
Michigan Univ., Ann Arbor
fDate :
6/1/2007 12:00:00 AM
Abstract :
This paper reports deposition of silicon at elevated and room temperatures in spatially localized areas of a microchip by plasma-enhanced chemical vapor deposition using microplasmas. The microplasmas are generated by providing dc power to thin-film Ti electrodes patterned on the microchip. Electrode arrangements include configurations in which multiple cathode elements share a single anode. At the operating pressures used, the plasma glow is confined to the region directly over the energized cathodes only, and the deposition is localized to these regions. A silane ambient allows Si to be deposited at 6.7-15.9 nm/min using cathode power densities of 3.65-9.35 W/cm2, with the substrate heated to 300degC. At room temperature, deposition rates up to 4.2 nm/min are realized. Also described is a plasma-coupling technique that permits isolated metal pads to be powered by plasma spreading from a proximate cathode at certain levels of power and pressure. This permits controlled variations of silicon thickness in a subarray of unbiased electrodes, simplifying the powering scheme.
Keywords :
plasma CVD; silicon; thin films; titanium; Si - Element; Ti - Surface; dc microplasmas; microchip; plasma glow; plasma spreading; plasma-coupling technique; plasma-enhanced chemical vapor deposition; silicon; temperature 293 K to 298 K; temperature 300 C; thin-film titanium electrodes; Cathodes; Chemical vapor deposition; DC generators; Electrodes; Plasma chemistry; Plasma confinement; Plasma density; Plasma temperature; Power generation; Silicon; Plasma-enhanced chemical vapor deposition (PECVD); polysilicon; thin-film deposition;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2007.897412