DocumentCode :
933773
Title :
Compact analytical model for room-temperature-operating silicon single-electron transistors with discrete quantum energy levels
Author :
Miyaji, Kousuke ; Saitoh, Masumi ; Hiramoto, Toshiro
Author_Institution :
Inst. of Ind. Sci., Univ. of Tokyo, Japan
Volume :
5
Issue :
3
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
167
Lastpage :
173
Abstract :
A compact and analytical model for silicon single-electron transistors (SETs) considering the discrete quantum energy levels and the parabolic tunneling barriers is proposed. The model is based on a steady-state master equation that considers only the three most probable states derived from ground level and the first excited level for each number of electrons in the dot to reduce the complexity while accounting for the quantum-level spacing and multiple peaks in Coulomb oscillation. Negative differential conductance (NDC) characteristics and aperiodic Coulomb oscillations due to nonuniform quantum-level spacings can be reproduced in this model. The model was compared with measurements, and good agreement was obtained. Simulations of some basic circuits that utilize NDC are successfully carried out by applying our model to the HSPICE circuit simulation. Our model can provide suitable environments for designing CMOS-combined room-temperature-operating highly functional SET circuits.
Keywords :
CMOS integrated circuits; Coulomb blockade; SPICE; circuit simulation; elemental semiconductors; integrated circuit design; master equation; semiconductor device models; silicon; single electron transistors; tunnelling; CMOS-combined room-temperature-operating highly functional SET circuits design; Coulomb oscillation; HSPICE circuit simulation; NDC characteristics; SET; Si; discrete quantum energy levels; excited level; ground level; negative differential conductance; parabolic tunneling barriers; quantum-level spacings; room-temperature-operating silicon single-electron transistors; steady-state master equation; Analytical models; CMOS technology; Circuit simulation; Energy states; Equations; Quantum dots; Silicon; Single electron transistors; Steady-state; Temperature; Compact analytical model; Coulomb oscillation; discrete quantum energy levels; negative differential conductance (NDC); reduced-state master equation method; silicon single-electron transistor (SET);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2006.869949
Filename :
1632129
Link To Document :
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