DocumentCode :
933858
Title :
Scanning the issue
Author :
Oppenheim, Alan V.
Author_Institution :
Massachusetts Institute of Technology, Cambridge
Volume :
63
Issue :
4
fYear :
1975
fDate :
4/1/1975 12:00:00 AM
Firstpage :
548
Lastpage :
549
Abstract :
Provides an overview of the technical articles and features presented in this issue.
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1975.9790
Filename :
1451720
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=933858
