• DocumentCode
    933909
  • Title

    “Sweet Spots” in Moderate Inversion for MOSFET Squarer Transconductors

  • Author

    Langlois, Peter J. ; Demosthenous, Andreas

  • Author_Institution
    Univ. Coll. London, London
  • Volume
    54
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    479
  • Lastpage
    483
  • Abstract
    Two "sweet spots" are analytically identified to enable MOSFET squarer differential transconductors to efficiently operate in moderate inversion. Measurements at low frequencies demonstrate the practicality of using moderate inversion when input signals are limited to about 200 mVpk-pk. At the first sweet spot, very low distortion of significantly less than 0.5% total harmonic distortion is possible. For comparison, the sweet spot for the third harmonic is shown for the linear differential transconductor. This brief also discusses the effect of the variations in threshold voltage on the location of the sweet spots, and demonstrates that this sensitivity can be greatly reduced using an appropriate biasing circuit. The proposed approach is of particular interest for low voltage and low current squarer transconductance applications.
  • Keywords
    MOSFET circuits; analogue circuits; harmonic distortion; low-power electronics; MOSFET squarer differential transconductors; biasing circuit; harmonic distortion; linear differential transconductor; low current applications; low frequencies measurements; low voltage squarer transconductance applications; moderate inversion operation; sweet spot location; threshold voltage variation; Distortion measurement; Frequency measurement; High definition video; Low voltage; MOSFET circuits; Radio frequency; Threshold voltage; Total harmonic distortion; Transconductance; Transconductors; Harmonic distortion (HD); MOSFET; linear transconductor; moderate inversion; squarer transconductor;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2007.892226
  • Filename
    4237368