• DocumentCode
    937101
  • Title

    Formation of electrically conducting mesoscale wires through self-assembly of atomic clusters

  • Author

    Partridge, Jim G. ; Scott, Shelley ; Dunbar, Alan D F ; Schulze, Monica ; Brown, Simon A. ; Wurl, Andreas ; Blaikie, Richard J.

  • Author_Institution
    Group, Univ. of Canterbury, Christchurch, New Zealand
  • Volume
    3
  • Issue
    1
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    61
  • Lastpage
    66
  • Abstract
    Bi and Sb clusters deposited from an inert gas aggregation source have been used to form cluster-assembled wires on unpassivated, and SiO2 passivated, V-grooved Si substrates. V-grooves (4-7 μm in width, 6 μm-1 mm in length) were prepared using optical lithography and anisotropic etching in KOH solution. The effectiveness of the surface templating technique was demonstrated by scanning electron microscope analysis carried out after deposition. When Sb clusters were deposited onto SiO2 passivated substrates, the surface coverage was seen to vary from <20% on the unpatterned (normal-to-beam) surface (which is required to be nonconducting) to >100% at the apexes of the V-grooves used to promote growth of the wire. Sb wires produced with this technique currently have minimum widths of ∼400 nm and lengths of ∼1 mm. Electrical contacts can be positioned within the V-grooves prior to cluster deposition, thus enabling the initial onset of conduction and subsequent I(V) characteristic of a wire to be monitored in vacuum.
  • Keywords
    anisotropic media; antimony; bismuth; electrical conductivity; etching; nanocontacts; nanolithography; nanowires; photolithography; scanning electron microscopy; self-assembly; vacuum deposition; 4 to 7 micron; 400 nm; 6 micron to 1 mm; Bi; Bi clusters; KOH solution; Sb; Sb clusters; Si; SiO2; V-grooved Si substrates; atomic clusters; cluster deposition; cluster-assembled wires; electrical contacts; electrically conducting mesoscale wires; inert gas aggregation source; optical lithography; scanning electron microscopy analysis; self-assembly; Anisotropic magnetoresistance; Atom optics; Atomic layer deposition; Bismuth; Electron optics; Etching; Geometrical optics; Lithography; Self-assembly; Wires;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2004.824026
  • Filename
    1278270