Title :
A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a Two-Port Network Analyzer (Comments)
Author :
Van Lil, Emmanuel
fDate :
3/1/1985 12:00:00 AM
Abstract :
In the above paper, Tippet and Speciale gave expressions for the correction to be made on the S matrix to account for the mismatches on the ports not connected to the network analyzer.
Keywords :
Dielectric measurements; Electron optics; Integrated optics; Optical scattering; Optical waveguide theory; Optical waveguides; Optimized production technology; Particle scattering; Rectangular waveguides; Transmission line matrix methods;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1985.1133003
