DocumentCode
939643
Title
An optimum approach for reduction of fiber alignment shift of fiber-solder-ferrule joints in laser module packaging
Author
Cheng, Wood-Hi ; Sheen, Maw-Tyan ; Chang, Chia-Ming ; Tseng, Yih-Tun
Author_Institution
Inst. of Electro-Opt. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
Volume
22
Issue
2
fYear
2004
Firstpage
589
Lastpage
594
Abstract
The results of experimental and numerical investigations leading to an optimum approach for the reduction of fiber alignment shift of fiber-solder-ferrule (FSF) joints in laser module packaging under temperature cycling test is presented. Using a novel image capture camera system as a monitor probe and the Sn -based solders as bonding materials, we have achieved the minimum fiber eccentric offsets of 8 and 20 μm in FSF joints with the PbSn and AuSn solders, respectively. After a 500-temperature cycling test, the fiber alignment shifts for these small initial fiber eccentric offsets of FSF joints were found to be 0.7 and 0.3 μm with the PbSn and AuSn solders, respectively. The measured fiber shifts were in good agreement with the numerical results of the finite-element method (FEM) analysis when both the residual stresses and the creep deformation within the solder were considered. This study have demonstrated that by soldering the fiber near to the center of the ferrule, and hence minimizing the fiber eccentric offset, the fiber alignment shifts of FSF joints in laser diode module packaging under temperature cycling test can be reduced significantly.
Keywords
creep; finite element analysis; image sensors; internal stresses; modules; optical fibre couplers; optical testing; packaging; soldering; solders; AuSn; FEM; FSF joints; PbSn; Sn-based solder; creep deformation; fiber alignment shift reduction; fiber eccentric offsets; fiber-solder-ferrule joints; finite element method analysis; image capture camera system; laser module packaging; residual stress; temperature cycling test; Cameras; Fiber lasers; Lead; Monitoring; Optical fiber testing; Packaging; Probes; State feedback; Temperature; Tin;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2004.824462
Filename
1278503
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