DocumentCode :
939880
Title :
Conditional Data Mapping Flip-Flops for Low-Power and High-Performance Systems
Author :
Teh, Chen Kong ; Hamada, Mototsugu ; Fujita, Tetsuya ; Hara, Hiroyuki ; Ikumi, Nobuyuki ; Oowaki, Yukihito
Author_Institution :
Corp. Res. Dev. Center, Toshiba Corp., Kawasaki
Volume :
14
Issue :
12
fYear :
2006
Firstpage :
1379
Lastpage :
1383
Abstract :
This paper introduces a new family of low-power and high-performance flip-flops, namely conditional data mapping flip-flops (CDMFFs), which reduce their dynamic power by mapping their inputs to a configuration that eliminates redundant internal transitions. We present two CDMFFs, having differential and single-ended structures, respectively, and compare them to the state-of-the-art flip-flops. The results indicate that both CDMFFs have the best power-delay product in their groups, respectively. In the aspect of power dissipation, the single-ended and differential CDMFFs consume the least power at data activity less than 50%, and are 31% and 26% less power than the conditional capture flip-flops at 25% data activity, respectively. In the aspect of performance, CDMFFs achieve small data-to-output delays, comparable to those of the transmission-gate pulsed latch and the modified-sense-amplifier flip-flop. In the aspect of timing reliability, CDMFFs have the best internal race immunity among pulse-triggered flip-flops. A post-layout case study is demonstrated with comparison to a transmission-gate flip-flop. The results indicate the single-ended CDMFF has 34% less in data-to-output delay and 28% less in power at 25% data activity, in spite of the 34% increase in size
Keywords :
flip-flops; high-speed integrated circuits; low-power electronics; CMOS digital integrated circuits; conditional data mapping flip-flops; differential structure; high-speed integrated circuits; low-power integrated circuits; modified sense amplifier flip-flop; power delay product; power dissipation; pulse-triggered flip-flops; redundant internal transitions; single-ended structure; timing reliability; transmission-gate pulsed latch; Clocks; Delay; Digital integrated circuits; Flip-flops; High speed integrated circuits; Latches; MOS devices; Power dissipation; Research and development; System-on-a-chip; CMOS digital integrated circuits; flip-flops; high-speed integrated circuits; low-power integrated circuits;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2006.887833
Filename :
4052355
Link To Document :
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