• DocumentCode
    939941
  • Title

    Microstructure, resistivity and critical currents of Ag-Bi/Pb(2223) tapes

  • Author

    Hensel, B. ; Grivel, J.-C. ; Jeremie, A. ; Perin, A. ; Pollini, A. ; Liniger, F. ; Flukiger, R.

  • Author_Institution
    Geneva Univ., Switzerland
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1139
  • Lastpage
    1142
  • Abstract
    The temperature and field dependences of critical current density, j/sub c/, in Ag-Bi/Pb(2223) tapes, prepared by the standard powder-in-tube method, have been measured between 4.2 K and 110 K in magnetic fields up to 15 T. The j/sub c/´s reproducibly reached values up to 20000 A/cm/sup 2/ at 77.35 K in zero magnetic field. After stripping or etching away the Ag-sheath, the microstructure of the superconductor core has been investigated by SEM, EDX and X-ray diffraction. On etched samples the resistance of the Bi(2223) filament has been measured. A value below 500 mu Omega -cm has been found for the resistivity at 130 K.<>
  • Keywords
    X-ray chemical analysis; X-ray diffraction examination of materials; bismuth compounds; calcium compounds; ceramics; critical current density (superconductivity); crystal microstructure; etching; high-temperature superconductors; lead compounds; magnetic field effects; powder technology; scanning electron microscope examination of materials; silver; strontium compounds; 130 K; 15 T; 4.2 to 110 K; Ag-(BiPb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10+y/; EDX; HTSC; SEM; X-ray diffraction; critical currents; etched samples; magnetic fields; microstructure; resistivity; standard powder-in-tube method; Conductivity; Critical current; Critical current density; Current measurement; Density measurement; Etching; Magnetic field measurement; Measurement standards; Microstructure; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233353
  • Filename
    233353