• DocumentCode
    940109
  • Title

    Potential of NdCeCuO thin films for electronic applications

  • Author

    Kussmaul, A. ; Tedrow, P.M. ; Gupta, A.

  • Author_Institution
    Francis Bitter Nat. Magnet Lab., Cambridge, MA, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1550
  • Lastpage
    1551
  • Abstract
    Films of NdCeCuO with high crystalline quality (channeling yield of 6%) were deposited on the low-loss material LaAlO/sub 3/, making it possible to measure the microwave surface losses at 18.29 GHz. An encouraging value of 1 m Omega was found at 4.2 K. The T/sub c/ is still lower than on SrTiO/sub 3/, but this is attributed to the fact that the deposition parameters have not yet been explored as systematically as for SrTiO/sub 3/. The deposition on artificial SrTiO/sub 3/ bicrystals yields grain boundaries with nonlinear I-V characteristics. The dynamic conductance looks similar to that observed on tunnel junctions of other high-T/sub c/ compounds, suggesting that quasiparticle tunneling is taking place for high-angle grain boundaries.<>
  • Keywords
    cerium compounds; grain boundaries; high-temperature superconductors; neodymium compounds; superconducting epitaxial layers; superconductive tunnelling; 18.29 GHz; 4.2 K; HTSC; LaAlO/sub 3/; NdCeCuO thin films; artificial SrTiO/sub 3/ bicrystals; channeling yield; deposition parameters; dynamic conductance; electronic applications; epitaxial films; grain boundaries; high crystalline quality; high-angle grain boundaries; laser ablation; low-loss material; microwave surface losses; nonlinear I-V characteristics; quasiparticle tunneling; Annealing; Laser ablation; Substrates; Superconducting epitaxial layers; Superconducting films; Superconducting magnets; Superconducting microwave devices; Superconducting thin films; Transistors; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233370
  • Filename
    233370