Noise properties of biepitaxial HTS junctions

The authors have measured the voltage noise across a biepitaxial junction at both low current, where the noise is dominated by critical current fluctuations, and at high current, where the noise is dominated by resistance fluctuations. They have used a phase-sensitive technique to show that the noise from these two regions is not correlated. This gives support to the suggestion that the normal and supercurrent components are carried through the junction in different channels. The result suggests that the normal and supercurrent components are carried through a series of parallel tracks.<>