• DocumentCode
    941307
  • Title

    Current gain of graded AlGaAs/GaAs heterojunction bipolar transistors with and without a base quasi-electric field

  • Author

    Liu, William ; Costa, Damian ; Harris, James S., Jr.

  • Author_Institution
    Solid State Lab., Stanford Univ., CA, USA
  • Volume
    39
  • Issue
    11
  • fYear
    1992
  • fDate
    11/1/1992 12:00:00 AM
  • Firstpage
    2422
  • Lastpage
    2429
  • Abstract
    Graded AlGaAs/GaAs heterojunction bipolar transistors with and without a base quasi-electric field are fabricated to investigate the various components of base current. The experimental results demonstrate that the base current for devices with extrinsic base surface passivation is dominated by base-emitter space-charge recombination current, rather than base bulk recombination current. Both a simple theoretical calculation and SEDAN (semiconductor device analysis) simulations are used to support this finding. SEDAN simulations also indicate strong effects of hole barrier lowering which reduces device current gain when the current gain approaches values of 1000 and when the maximum aluminum composition in the AlGaAs emitter is ⩽30%. The experimental finding that space-charge recombination current dominates the base current in passivated graded HBTs agrees well with published theoretical work. This work and other published experimental and theoretical works are compared and discussed
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; passivation; semiconductor device models; AlGaAs-GaAs; SEDAN simulations; base current; base quasi-electric field; base-emitter space-charge recombination current; current gain; experimental results; extrinsic base surface passivation; graded HBTs; heterojunction bipolar transistors; hole barrier lowering; semiconductor device analysis; semiconductors; Aluminum; Analytical models; Bipolar transistors; Gallium arsenide; Heterojunction bipolar transistors; Laboratories; Passivation; Radiative recombination; Semiconductor devices; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.163447
  • Filename
    163447