Title :
The effects of smear on antiblooming protection and dynamic range of interline CCD image sensors
Author :
Stevens, Eric G. ; Lee, Yung-Rai ; Burkey, Bruce C.
Author_Institution :
Eastman Kodak Co., Rochester, NY, USA
fDate :
11/1/1992 12:00:00 AM
Abstract :
The effects of a smearing signal on the dynamic range and the amount of antiblooming protection of an interline CCD image sensor are presented. It is shown that there is a tradeoff between these two parameters, and that they are directly related by the amount of smear. These relationships are analyzed for both constant-integration time and constant-irradiance modes of operation. For the constant-irradiance model of operation it is shown that in order to maintain 90% of the maximum dynamic range and an antiblooming protection of 300×, the smear signal must be less than 0.037%. For the constant integration-time mode of operation, it is shown that in order to maintain 75% of a particular device´s maximum dynamic range and the same amount of antiblooming protection the smear signal must be less than 0.0074%. It is also found in this mode that this relationship between antiblooming protection and the amount of linear dynamic range is exponential, and dependent on the antiblooming structure´s nonideality factor and the individual photodetector´s capacitance
Keywords :
CCD image sensors; antiblooming protection; constant integration-time mode of operation; constant-irradiance model of operation; dynamic range; image smear; interline CCD image sensors; nonideality factor; photodetectors capacitance; smearing signal; tradeoff; Capacitance; Charge coupled devices; Charge-coupled image sensors; Dynamic range; Image sensors; Photoconductivity; Protection; Sensor phenomena and characterization; Silicon; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on