Title :
The Panel on Electron Tubes Program for Coordinating Tube Reliability Activities
Author_Institution :
Panel on Electron Tubes Secretariat, New York University, New York, N. Y.
Keywords :
Circuits; Defense industry; Electron tubes; Failure analysis; Laboratories; Microwave devices; Military standards; NIST; Research and development; Semiconductor devices;
Journal_Title :
Quality Control, Transactions of the IRE Professional Group on
DOI :
10.1109/IRE-PGQC.1954.5007109
