• DocumentCode
    942371
  • Title

    A high resolution imaging susceptometer

  • Author

    Ma, Y.P. ; Thomas, I.M. ; Lauder, A. ; Wikswo, J.P., Jr.

  • Author_Institution
    Dept. of Phys. & Astron., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1941
  • Lastpage
    1944
  • Abstract
    A high-resolution, MicroSQUID (superconducting quantum interference device)-based susceptometer has been constructed for imaging the susceptibility distribution in diamagnetic and paramagnetic objects. The maximum available applied field, produced by the Helmholtz pair, is 300 mu T, which provides an adequate signal-to-noise ratio for common susceptible materials. The calculated variation in the applied field within 20 mm of the center is less than 0.1% of the field at the center. In a 100-Hz bandwidth, the minimum detectable susceptibility-induced field change, (limited by SQUID noise) is 3*10/sup -9/ of the applied field. The sensitivity of the system may be improved by increasing the applied field, for instance by incorporating a superconducting magnet into the magnetometer dewar, and by using lower-noise SQUIDs.<>
  • Keywords
    SQUIDs; diamagnetism; magnetic field measurement; magnetic susceptibility; magnetometers; nondestructive testing; paramagnetism; 100 Hz; 300 muT; Helmholtz pair; MicroSQUID; NDE; SQUID noise; applied field; diamagnetic objects; high resolution imaging susceptometer; magnetometer dewar; minimum detectable susceptibility-induced field change; paramagnetic objects; sensitivity; signal-to-noise ratio; superconducting magnet; superconducting quantum interference device; susceptibility distribution; Bandwidth; High-resolution imaging; Interference; Paramagnetic materials; SQUIDs; Signal to noise ratio; Superconducting device noise; Superconducting devices; Superconducting magnets; Superconducting materials;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233580
  • Filename
    233580