• DocumentCode
    942545
  • Title

    Potential of polycrystalline YBCO layers for applications

  • Author

    Hein, M. ; Hill, F. ; Muller, G. ; Piel, H. ; Schneider, H.P. ; Strupp, M.

  • Author_Institution
    Bergischen, Univ. Wuppertal, Germany
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1745
  • Lastpage
    1748
  • Abstract
    The granular properties of polycrystalline YBCO layers are characterized by their surface impedance, Z/sub s/, measured as a function of temperature, frequency and magnetic field. A model for Z/sub s/, based on grain-boundaries acting as resistively and inductively shunted Josephson junctions, is used for a conclusive analysis of the field sensitivity of Z/sub s/ and of the frequency dependence of the surface resistance. It is shown that reducing the granular character of polycrystalline samples leads to a lower absolute level and to a stronger frequency dependence of R/sub s/. As a result, the frequency-dependent improvement r=R/sub s/(Cu)/R/sub s/(YBCO), as well as the frequency at which r=1, can be increased.<>
  • Keywords
    barium compounds; electric resistance measurement; grain boundaries; grain size; high-temperature superconductors; microwave measurement; scanning electron microscope examination of materials; superconducting thin films; surface conductivity; yttrium compounds; 21.5 GHz; 77 K; SEM; YBaCuO polycrystalline layers; field sensitivity; frequency dependence; grain size; grain-boundaries; granular properties; high temperature superconductor; inductively shunted Josephson junctions; magnetic field; resistively shunted Josephson junction; surface impedance; surface resistance; temperature dependence; Frequency dependence; Frequency measurement; Impedance measurement; Josephson junctions; Magnetic field measurement; Magnetic properties; Surface impedance; Surface resistance; Temperature sensors; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233597
  • Filename
    233597