DocumentCode

944004

Title

Statistical Approach to Reliability Improvement of the Tantalum Capacitor

Author

Demos, Nicholas P.

Author_Institution

General Engrg. Lab. General Electric Co. Schenectady, N.Y.

Issue

2

fYear

1960

Firstpage

29

Lastpage

33

Keywords

Appraisal; Capacitors; Inspection; Laboratories; Manufacturing; Mathematical analysis; Missiles; Reliability engineering; Shafts; Testing;

fLanguage

English

Journal_Title

Reliability and Quality Control, IRE Transactions on

Publisher

ieee

ISSN

0097-4552

Type

jour

DOI

10.1109/IRE-PGRQC.1960.5007291

Filename

5007291