Techniques for testing the microcomputer family

This paper defines the microcomputer family in terms of random-access memories (RAM´s) and the microprocessor unit (MPU), illustrates test techniques applicable to these devices, and provides information concerning the equipment necessary to perform the task of testing. Several test patterns specifically designed for 4096-bit RAM´s (GALTCOL and DIAPAT) are presented. The concept of comparison with a known good device and a new approach called modular sensorialization are illustrated for MPU´s. Methods for testing memory and random-logic boards and a summary of commercially available test equipment are also included.