• DocumentCode
    946089
  • Title

    Influence of substrate and biasing current on response of YBCO microbolometers

  • Author

    Li, K. ; Johnson, J.E.

  • Author_Institution
    Boeing Defense & Space Group, Seattle, WA, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    2111
  • Lastpage
    2114
  • Abstract
    The authors fabricated YBCO thin films by RF magnetron sputter deposition onto ZrO/sub 2/, SrTiO/sub 3/, LaAlO/sub 3/, and MgO substrates and patterned these films into microbolometers. The influence of substrate type and device biasing current on the response of the microbolometers was measured. The responsivity and the speed of the devices were found to depend on the thermal conductivity of the substrates used. The fastest YBCO device was found on MgO, whereas the largest bolometric response was found on ZrO/sub 2/. It was found that the responsivity of a microbolometer increased with biasing current, but there was an optimal biasing current beyond which device performance deteriorated due to self heating. The results indicate that the most sensitive microbolometer requires a sharp YBCO resistivity transition, a low thermal conductivity substrate, and an optimal biasing current.<>
  • Keywords
    barium compounds; bolometers; high-temperature superconductors; infrared detectors; microwave detectors; superconducting junction devices; superconducting microwave devices; yttrium compounds; HTSC; IR detection; LaAlO/sub 3/ substrate; MgO substrate; SrTiO/sub 3/ substrate; YBaCuO microbolometers; ZrO/sub 2/ substrate; biasing current; influence of substrate type; low thermal conductivity substrate; responsivity; self heating; sharp resistivity transition; sputtered films; Bolometers; Heat sinks; High temperature superconductors; Infrared detectors; Sputtering; Substrates; Superconducting transition temperature; Thermal conductivity; Thermal resistance; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233918
  • Filename
    233918