DocumentCode
947501
Title
Supply-current analysis (scan) as a screen for bipolar integrated circuits
Author
Melia, A.J.
Author_Institution
Post Office, Research Department, Ipswich, UK
Volume
14
Issue
14
fYear
1978
Firstpage
434
Lastpage
436
Abstract
A novel technique utilising the analysis of supply-current variations is proposed as a screen for digital integrated circuits. The application of the method to a simple m.s.i. circuit is used to demonstrate its capability of indicating the presence of flaws at internal circuit nodes.
Keywords
bipolar integrated circuits; digital integrated circuits; integrated circuit testing; bipolar integrated circuits; digital integrated circuits; screen; supply current analysis;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19780291
Filename
4242570
Link To Document