DocumentCode
948827
Title
Industrial Measurements with X-Rays
Author
Bigelow, J.E.
Author_Institution
General Electric Company, Milwaukee, Wis.
fYear
1958
fDate
5/1/1958 12:00:00 AM
Firstpage
121
Lastpage
127
Abstract
A review is made of the application of x-ray photoelectric effect and scattering to diverse problems of measurement. The basis of operation of thickness and coating weight gages, spectrographic analyzers, diffraction apparatus, and inspection equipment will thereby be shown. It is recognised that many of the measurements now being made with x-rays could be made in no other way; thus, it is especially hoped that a useful solution may be suggested for yet unsolved problems.
Keywords
Atomic measurements; Coatings; Electromagnetic scattering; Electromagnetic wave absorption; Electrons; Extraterrestrial measurements; Inspection; Particle scattering; X-ray diffraction; X-ray scattering;
fLanguage
English
Journal_Title
Industrial Electronics, IRE Transactions on
Publisher
ieee
ISSN
0197-5706
Type
jour
DOI
10.1109/IRE-IE.1958.5007836
Filename
5007836
Link To Document