DocumentCode
949031
Title
Robust Recovery of Shapes with Unknown Topology from the Dual Space
Author
Liang, Chen ; Wong, Kwan-Yee K.
Author_Institution
Univ. of Hong Kong, Hong Kong
Volume
29
Issue
12
fYear
2007
Firstpage
2205
Lastpage
2216
Abstract
In this paper, we address the problem of reconstructing an object surface from silhouettes. Previous works by other authors have shown that, based on the principle of duality, surface points can be recovered, theoretically, as the dual to the tangent plane space of the object. In practice, however, the identification of tangent basis in the tangent plane space is not trivial given a set of discretely sampled data. This problem is further complicated by the existence of bitangents to the object surface. The key contribution of this paper is the introduction of epipolar parameterization in identifying a well-defined local tangent basis. This extends the applicability of existing dual space reconstruction methods to fairly complicated shapes without making any explicit assumption on the object topology. We verify our approach with both synthetic and real-world data and compare it both qualitatively and quantitatively with other popular reconstruction algorithms. Experimental results demonstrate that our proposed approach produces more accurate estimation while maintaining reasonable robustness toward shapes with complex topologies.
Keywords
computational geometry; feature extraction; image reconstruction; object detection; solid modelling; surface reconstruction; topology; 3D model; dual space; epipolar parameterization; object surface reconstruction; object topology; robust shapes recovery; silhouette information; tangent plane space; Reconstruction; duality principle; epipolar parameterization; surface extraction; tangent envelope; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2007.1127
Filename
4359295
Link To Document