• DocumentCode
    949074
  • Title

    The propagation characteristics of wave-guiding structures with very thin superconductors; application to coplanar waveguide YBa2 Cu3O7-x resonators

  • Author

    Klopman, Boele B G ; Gerritsma, Gerrit J. ; Rogalla, Horst

  • Author_Institution
    Dept. of Appl. Phys., Twente Univ., Enschede, Netherlands
  • Volume
    41
  • Issue
    5
  • fYear
    1993
  • fDate
    5/1/1993 12:00:00 AM
  • Firstpage
    781
  • Lastpage
    791
  • Abstract
    The propagation characteristics of waveguiding structures with superconductors which are thin compared to the magnetic penetration depth are analyzed. The complex propagation constant is evaluated within the framework of the modified spectral domain method without the need for numerical calculations in the complex plane. Good agreement is found with the results of other methods. The numerical analysis is instrumental in deducing results for the penetration depth and the surface resistance of YBa2Cu3O7-x thin films on sapphire with a PrBa2Cu3O7-x buffer layer. Recent observations of a non-single-gap BCS temperature dependence are confirmed
  • Keywords
    barium compounds; electric resistance; high-temperature superconductors; penetration depth (superconductivity); resonators; spectral-domain analysis; strip line components; superconducting microwave devices; superconducting thin films; waveguide theory; yttrium compounds; Al2O3; BCS temperature dependence; CPW; PrBa2Cu3O7-x buffer layer; YBa2Cu3O7-PrBa2Cu 3O7-Al2O3; complex propagation constant; coplanar waveguide; modified spectral domain method; numerical analysis; penetration depth; propagation characteristics; sapphire; surface resistance; very thin superconductors; wave-guiding structures; waveguiding structures; Buffer layers; Instruments; Magnetic analysis; Magnetic domains; Numerical analysis; Propagation constant; Superconducting magnets; Superconductivity; Surface resistance; Transistors;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.234511
  • Filename
    234511