DocumentCode
949185
Title
A Marked Point Process of Rectangles and Segments for Automatic Analysis of Digital Elevation Models
Author
Ortner, Mathias ; Descombes, Xavier ; Zerubia, Josiane
Author_Institution
INRIA Sophia Antipolis, Sophia Antipolis
Volume
30
Issue
1
fYear
2008
Firstpage
105
Lastpage
119
Abstract
This work presents a framework for automatic feature extraction from images using stochastic geometry. Features in images are modeled as realizations of a spatial point process of geometrical shapes. This framework allows the incorporation of a priori knowledge on the spatial repartition of features. More specifically, we present a model based on the superposition of a process of segments and a process of rectangles. The former is dedicated to the detection of linear networks of discontinuities, whereas the latter aims at segmenting homogeneous areas. An energy is defined, favoring connections of segments, alignments of rectangles, and a relevant interaction between both types of objects. The estimation is performed by minimizing the energy using a simulated annealing algorithm. The proposed model is applied to the analysis of digital elevation models (DEMs). These images are raster data representing the altimetry of a dense urban area. We present results on real data provided by the French National Geographic Institute (IGN) consisting in low-quality DEMs of various types.
Keywords
building; computational geometry; feature extraction; image segmentation; simulated annealing; stochastic processes; automatic feature extraction; data representation; dense urban area; digital elevation model analysis; image segmentation; linear network; simulated annealing algorithm; spatial feature repartition; stochastic geometry; Digital Elevation Models; Image processing; MCMC; Poisson point process; RJMCMC; building detection; dense urban area; land register; simulated annealing; stochastic geometry; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2007.1159
Filename
4359309
Link To Document