TM scattering from a slit in a thick conducting screen: revisited

Author

Kang, Soo H. ; Eom, Hyo J. ; Park, Tah J.

Author_Institution

Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea

Volume

41

Issue

5

fYear

1993

fDate

5/1/1993 12:00:00 AM

Firstpage

895

Lastpage

899

Abstract

TM plane wave scattering from a slit in a thick conducting screen is examined. A Fourier transform technique is employed to express the scattered field in the spectral domain and the boundary conditions are enforced to obtain simultaneous equations for the transmitted field inside the thick conducting screen. The simultaneous equations are solved to represent the transmitted and scattered fields in series forms. Approximate series solutions for scattering and transmission are obtained in closed-forms which are valid for high-frequency scattering regime

Keywords

Fourier transforms; electromagnetic wave scattering; Fourier transform technique; TM scattering; boundary conditions; closed-forms; high-frequency scattering regime; plane wave scattering; scattered field; simultaneous equations; spectral domain; thick conducting screen; transmitted field; Conductors; Copper; Electromagnetic scattering; Finite difference methods; Frequency; Microwave theory and techniques; Rough surfaces; Surface resistance; Surface roughness; Surface treatment;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.234533

Filename

234533