• DocumentCode
    949650
  • Title

    Multilayer APDs producing up to two impact ionisations per carrier per stage: optical receiver performance analysis

  • Author

    Fyath, R.S. ; O´Reilly, J.J.

  • Author_Institution
    University College of North Wales, School of Engineering Science, Bangor, UK
  • Volume
    135
  • Issue
    2
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    101
  • Lastpage
    108
  • Abstract
    Previous analyses of the gain and noise properties of superlattice avalanche photodiodes (APDs) are extended to allow for the production of up to two impact ionisations per initiating carrier per stage. The sensitivity of optical receivers employing these advance APD structures is determined, allowing for the influence both of residual hole ionisation and dark current. These devices are found to have higher gain and noise figures than their single ionisation electron counterparts. Receiver sensitivity studies are reported, which indicate that dark current and residual hole ionisation are of increased significance, but that provided these effects are small, improved performance is obtained.
  • Keywords
    avalanche photodiodes; impact ionisation; optical communication equipment; receivers; semiconductor superlattices; dark current; gain; impact ionisations; ionisation electron counterparts; multilayer APD; noise; optical receiver performance analysis; residual hole ionisation; superlattice avalanche photodiodes;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings J
  • Publisher
    iet
  • ISSN
    0267-3932
  • Type

    jour

  • DOI
    10.1049/ip-j.1988.0023
  • Filename
    4648680