• DocumentCode
    950091
  • Title

    Validation of an SEU simulation technique for a complex processor: PowerPC7400

  • Author

    Rezgui, Sana ; Swift, Gary M. ; Velazco, Raoul ; Farmanesh, Farhad F.

  • Author_Institution
    TIMA Lab., Grenoble, France
  • Volume
    49
  • Issue
    6
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    3156
  • Lastpage
    3162
  • Abstract
    Results from fault injection experiments on a modern complex processor, the PPC7400, are combined with static register ground testing to predict single-event upset rates of several benchmark application programs. These results compare favorably with in-beam measurements on the same programs.
  • Keywords
    fault diagnosis; integrated circuit testing; ion beam effects; microprocessor chips; space vehicle electronics; PowerPC7400 microprocessors; SEU simulation technique; benchmark application programs; code emulating upset injection method; complex processor; error-rate prediction methodology; extraterrestrial radiation effects; fault injection experiments; heavy-ion testing; ion radiation effects; processor errors; single-event upset rates; static register ground testing; Benchmark testing; Circuit faults; Circuit testing; Integrated circuit testing; Laboratories; Microprocessors; Radiation effects; Registers; Semiconductor device testing; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2002.805982
  • Filename
    1134275
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=950091