DocumentCode :
950198
Title :
Total-dose and single-event effects in switching DC/DC power converters
Author :
Adell, P.C. ; Schrimpf, R.D. ; Choi, B.K. ; Holman, W.T. ; Attwood, J.P. ; Cirba, C.R. ; Galloway, K.F.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Volume :
49
Issue :
6
fYear :
2002
fDate :
12/1/2002 12:00:00 AM
Firstpage :
3217
Lastpage :
3221
Abstract :
Total-dose and single-event effects in discrete switching DC/DC power converters are examined using a combination of circuit measurements and simulations. The total-dose experiments focus on the response of the power MOSFET used as the switching element for the converters. The efficiencies of two different types of converters (boost and buck) degrade with increasing total dose, leading to eventual functional failure. The single-event transient response of the converters is determined by the response of the feedback control circuitry. Radiation response is studied using both electrical measurements and simulation techniques, and issues affecting circuit failure are identified.
Keywords :
DC-DC power convertors; PWM power convertors; X-ray effects; circuit reliability; circuit simulation; failure analysis; power MOSFET; transient response; 100 krad; boost converters; buck converters; circuit failure; circuit measurements; circuit simulations; electrical measurements; feedback control circuitry response; functional failure; power MOSFET response; pulse width modulation; radiation response; single-event effects; single-event transient response; switching DC/DC power converters; switching element; total dose; total-dose effects; x-ray source; Circuit simulation; Degradation; Feedback circuits; Feedback control; MOSFET circuits; Power MOSFET; Power measurement; Switching circuits; Switching converters; Transient response;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2002.805425
Filename :
1134285
Link To Document :
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