• DocumentCode
    950485
  • Title

    11th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2004)

  • Volume
    4
  • Issue
    1
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    119
  • Lastpage
    119
  • Abstract
    Provides notice of upcoming conference events of interest to practitioners and researchers.
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2004.827881
  • Filename
    1284309
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=950485