Surface resistance measurements of HTS films by means of sapphire dielectric resonators

Author

Krupka, J. ; Klinger, M. ; Kuhn, M. ; Baryanyak, A. ; Stiller, M. ; Hinken, J. ; Modelski, J.

Author_Institution

Inst. Mikroelektroniki i Optoelektroniki Politech. Warszawskiej, Warszawa, Poland

Volume

3

Issue

3

fYear

1993

Firstpage

3043

Lastpage

3048

Abstract

A sapphire dielectric resonator with a copper cylindrical shield and two endplates replaced by high-temperature superconducting (HTS) layers was used for very accurate surface resistance measurements on laser-ablated YBCO films. A system using the TE/sub 011/ mode has a resonant frequency of about 18.1 GHz and parasitic-loss Q factor of about 120000. It allows 10 mm*10 mm samples to be measured with sensitivity of +or-30 mu Omega . Individual samples can be measured with somewhat lower accuracy. Using larger HTS samples, one can reduce parasitic losses of the system to an unsignificant level. The exact formulas presented for the resonant system allow for avoiding calibration procedures during the evaluation of the surface resistance.<>

Keywords

barium compounds; dielectric resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; pulsed laser deposition; sapphire; superconducting thin films; surface conductivity; yttrium compounds; 18.1 GHz; Al/sub 2/O/sub 3/; Cu cylindrical shield; HTS films; TE/sub 011/ mode; YBaCuO laser ablated film; high temperature superconducting layers; parasitic-loss Q factor; resonant frequency; sapphire dielectric resonator; sensitivity; surface resistance measurements; Dielectrics; Electrical resistance measurement; High temperature superconductors; Laser modes; Superconducting epitaxial layers; Superconducting films; Surface emitting lasers; Surface resistance; Tellurium; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.234839

Filename

234839