DocumentCode
951114
Title
Correspondence: Comments on "1/f Noise in Metal Contacts and Granular Resistors"
Author
Vandamme, L.K.J.
Author_Institution
University of Technology,Netherlands
Volume
10
Issue
2
fYear
1987
fDate
6/1/1987 12:00:00 AM
Firstpage
290
Lastpage
291
Abstract
A model is presented in the above paper based on temperature fluctuations of the small conducting spots inducing conductivity fluctuations. The observed experimental results are in qualitative agreement with those of the model. In this comment arguments will be presented which are at variance with the temperature fluctuation model. Their experimental results can be described by the empirical 1/f noise relation.
Keywords
Contacts; Thick-film circuit noise; Thick-film resistors; Charge measurement; Contact resistance; Copper; Current measurement; Fluctuations; Q measurement; Resistors; Temperature distribution; Thermal resistance; Voltage;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1987.1134718
Filename
1134718
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