• DocumentCode
    951297
  • Title

    Electron waveguiding characteristics and ballistic current capacity of semiconductor quantum slabs

  • Author

    Wilson, Daniel W. ; Glytsis, Elias N. ; Gaylord, Thomas K.

  • Author_Institution
    Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    29
  • Issue
    5
  • fYear
    1993
  • fDate
    5/1/1993 12:00:00 AM
  • Firstpage
    1364
  • Lastpage
    1382
  • Abstract
    Semiconductor slab electron waveguides with and without spatially varying effective mass are analyzed using the single-band effective-mass equation. Starting with ballistic electron incidence on a potential energy/effective mass interface, expressions for the phase shift, the lateral shift, and the time delay upon total internal reflection are found. It is shown that heterostructure wells, homostructure voltage-induced wells, and heterostructure barriers can act as waveguides for ballistic electrons, and that the waveguiding is described by a single dispersion relation. The guided mode wave functions, dispersion curves, cutoffs, group velocity. effective mass, density of states, and ballistic guided current density are determined
  • Keywords
    dispersion relations; high-frequency effects; quantum interference phenomena; reflectivity; semiconductor quantum wells; two-dimensional electron gas; waveguides; ballistic current capacity; ballistic electron incidence; density of states; effective mass interface; guided mode wave functions; heterostructure barriers; heterostructure wells; homostructure voltage-induced wells; lateral shift; phase shift; potential energy; semiconductor quantum slabs; single dispersion relation; single-band effective-mass equation; slab electron waveguides; spatially varying effective mass; time delay; total internal reflection; Delay effects; Dispersion; Effective mass; Electrons; Equations; Potential energy; Reflection; Semiconductor waveguides; Slabs; Voltage;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.236150
  • Filename
    236150